[원서] White M., Bernstein J.B. - Microelectronics Reliability Physics-…
페이지 정보
작성일 20-04-03 04:57
본문
솔루션,전기전자,솔루션
설명
순서
[원서] White M., Bernstein J.B. - Microelectronics Reliability Physics-of-Failure Based Modeling and Lifetime Evaluation , [원서] White M., Bernstein J.B. - Microelectronics Reliability Physics-of-Failure Based Modeling and Lifetime Evaluation전기전자솔루션 , 솔루션
솔루션/전기전자






[원서] White M., Bernstein J.B. - Microelectronics Reliability Physics-of-Failure Based Modeling and Lifetime Evaluation
癤 National Aeronautics and Space Administration
Microelectronics Reliability: Physics-of-Failure Based Modeling and Lifetime Evaluation
Mark White
Jet Propulsion Laboratory Pasadena, California
Joseph B. Bernstein University of Maryland College Park, Maryland
Jet Propulsion Laboratory Califor…(drop)
Download : White M Bernstein J B Microelectronics Reliability Physics of Failure Based Modeling and Lifetime Evaluation.pdf( 21 )
[원서] White M., Bernstein J.B. - Microelectronics Reliability Physics-of-Failure Based Modeling and Lifetime Evaluation
다.